A probe can image perfectly and still fail its electrical safety test. The limit a leakage reading is judged against changes with the probe's applied-part class, the grounding condition and the mains voltage, and the manufacturer's own tables say so.
A dark line that stays in place as the probe moves belongs to an array element, and the picture has four possible owners. What the in-air test, an element tester and a phantom each read, what the sensitivity thresholds mean, and why two adjacent dead elements matter more than six scattered.
Pitch is the centre-to-centre distance between array elements — the sum of element width and kerf. It is not the number that sets resolution. It is the number that decides how far a beam can be steered before a second, equally strong lobe appears somewhere it was not aimed.
The VIVID E9 service manual prints the same first remedy for a touch panel that activates the wrong control and for one that stops answering. What the calibration dialog moves, where the system's other calibration lives, and what the escalation order is really covering.
A TEE probe's bending section cannot report its own condition, and some current models publish no deflection range to compare it against. What each class of document can settle — and the baseline you have to record yourself.
A specification sheet interleaves two kinds of fact and presents them in the same format: what the instrument is, and which version of it you have. This is how the parameters group, where the design trade-offs are documented, and where the category boundaries actually fall.